{"created":"2023-06-19T09:51:11.934426+00:00","id":8254,"links":{},"metadata":{"_buckets":{"deposit":"7ac8e58a-de83-48e2-b965-75433cea4f69"},"_deposit":{"created_by":3,"id":"8254","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8254"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00008254","sets":["502:505:675:714"]},"author_link":["44394","44393","44395"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2006-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"12","bibliographicPageStart":"7","bibliographicVolumeNumber":"30","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"香川, 直己"}],"nameIdentifiers":[{"nameIdentifier":"44393","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Shape, arrangement, scale of the test substrate and the number of impressed points of the common mode noise are examined for the optimum conditions of the immunity test by the workbench faraday cage. WBFC, method. According to analytical and measurement results of the input impedance to the WBFC and the characteristic impedance on the transmission line, the scale installed on all sides 20mm is the best for the test object. When the number of common mode points is increased, the impedance matching is able to be aimed at, and if it is 100mmx100mm substrate, it became a result that the case to assume the number of common modes in which the terminal is assumed to be 3 pieces is excellent. On the other hand. in case of 100mmx100mm substrate, the surface current of the substrate is homogeneous when the number of common mode points is two.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"44394","nameIdentifierScheme":"WEKO"}],"names":[{"name":"カガワ, ナオキ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"44395","nameIdentifierScheme":"WEKO"}],"names":[{"name":"KAGAWA, Naoki","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electronic and Electrical Engineering, Faculty of Engineering, Fukuyama University"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子・電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2006-12-01"}],"displaytype":"detail","filename":"KJ00005781669.pdf","filesize":[{"value":"1.7 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/8254/files/KJ00005781669.pdf"},"version_id":"b88bf3d6-3ed0-497f-bd91-e30104013825"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"EMC","subitem_subject_scheme":"Other"},{"subitem_subject":"WBFC法","subitem_subject_scheme":"Other"},{"subitem_subject":"コモンモード","subitem_subject_scheme":"Other"},{"subitem_subject":"イミュニティ","subitem_subject_scheme":"Other"},{"subitem_subject":"集積回路","subitem_subject_scheme":"Other"},{"subitem_subject":"EMC","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"WBFC method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"common mode","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"immunity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"integrated circuits","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"WBFC法によるイミュニティ試験の最適条件に関する検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"WBFC法によるイミュニティ試験の最適条件に関する検討"},{"subitem_title":"Study on the optimum conditions of immunity test by the WBFC method","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["714"],"pubdate":{"attribute_name":"公開日","attribute_value":"2006-12-01"},"publish_date":"2006-12-01","publish_status":"0","recid":"8254","relation_version_is_last":true,"title":["WBFC法によるイミュニティ試験の最適条件に関する検討"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:26:50.028739+00:00"}