{"created":"2023-06-19T09:51:08.239589+00:00","id":8167,"links":{},"metadata":{"_buckets":{"deposit":"23fe598e-f862-49ce-b312-767e11e0a13d"},"_deposit":{"created_by":3,"id":"8167","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8167"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00008167","sets":["502:505:675:712"]},"author_link":["43829","43831","43830"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2004-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"37","bibliographicPageStart":"31","bibliographicVolumeNumber":"28","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"香川, 直己"}],"nameIdentifiers":[{"nameIdentifier":"43829","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"The author made a workbench faraday cage, WBFC, in order to estimate performance of the WBFC method for the measurement of common mode noise immunity of integrated circuits. In this report, characteristics of the constructed workbench faraday cage and results of experimental study of effects of the common mode noise on a circuit board including an electronic device are shown. Selected DUT, LM324 is popular operational amplifier for electrical circuits in vehicles.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"43830","nameIdentifierScheme":"WEKO"}],"names":[{"name":"カガワ, ナオキ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"43831","nameIdentifierScheme":"WEKO"}],"names":[{"name":"KAGAWA, Naoki","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electronic and Electrical Engineering, Faculty of Engineering, Fukuyama University"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子・電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2004-12-01"}],"displaytype":"detail","filename":"KJ00005781563.pdf","filesize":[{"value":"894.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/8167/files/KJ00005781563.pdf"},"version_id":"e4a6c318-3536-4840-833b-2309fa86159f"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"WBFC法","subitem_subject_scheme":"Other"},{"subitem_subject":"コモンモード","subitem_subject_scheme":"Other"},{"subitem_subject":"オペアンプ","subitem_subject_scheme":"Other"},{"subitem_subject":"イミュニティ","subitem_subject_scheme":"Other"},{"subitem_subject":"集積回路","subitem_subject_scheme":"Other"},{"subitem_subject":"WBFC method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"common mode","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"operational amplifier","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"immunity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"integrated circuits","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"WBFC法による半導体イミュニティ測定に関する実験的検討","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"WBFC法による半導体イミュニティ測定に関する実験的検討"},{"subitem_title":"Experimental Study of WBFC method for testing electromagnetic immunity of integrated circuits","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["712"],"pubdate":{"attribute_name":"公開日","attribute_value":"2004-12-01"},"publish_date":"2004-12-01","publish_status":"0","recid":"8167","relation_version_is_last":true,"title":["WBFC法による半導体イミュニティ測定に関する実験的検討"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:28:30.214415+00:00"}