{"created":"2023-06-19T09:51:07.429716+00:00","id":8148,"links":{},"metadata":{"_buckets":{"deposit":"e7d50e48-1df7-4ed9-ae2a-d44f8e0d2aca"},"_deposit":{"created_by":3,"id":"8148","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"8148"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00008148","sets":["502:505:675:711"]},"author_link":["43733","43738","43732","43735","43734","43737","43730","43731","43736"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2003-12","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"203","bibliographicPageStart":"199","bibliographicVolumeNumber":"27","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"坪井, 始"}],"nameIdentifiers":[{"nameIdentifier":"43730","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"瀬島, 紀夫"}],"nameIdentifiers":[{"nameIdentifier":"43731","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田中, 始男"}],"nameIdentifiers":[{"nameIdentifier":"43732","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Magnetic field analysis of nondestructive testing using remanent magnetism was performed by using two-dimensional finite element method. A leakage flux method using remanent magnetism is applied to magnetic material as nondestructive testing method. The remanent magnetism is approximated by equivalent magnetizing electric current. And we assumed that the remanent magnetization is in proportion to the magnetization in the magnetizing process. Formulation of the finite element method using magnetization is described. A simple model was used to confirm the applicability of the leakage flux method using remanent magnetism. It became clear that small lift-off of probe was required to detect small defects because magnetic field induced by the remanent magnetism decreased rapidly with distance from the defect.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"43733","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ツボイ, ハジメ"}]},{"nameIdentifiers":[{"nameIdentifier":"43734","nameIdentifierScheme":"WEKO"}],"names":[{"name":"セシマ, ノリオ"}]},{"nameIdentifiers":[{"nameIdentifier":"43735","nameIdentifierScheme":"WEKO"}],"names":[{"name":"タナカ, モトオ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"43736","nameIdentifierScheme":"WEKO"}],"names":[{"name":"TSUBOI, Hajime","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"43737","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SESHIMA, Norio","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"43738","nameIdentifierScheme":"WEKO"}],"names":[{"name":"TANAKA, Motoo","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Information Processing Engineering, Faculty of Engineering, Fukuyama University"},{"subitem_text_language":"en","subitem_text_value":"Fukuyama University"},{"subitem_text_language":"en","subitem_text_value":"Department of Information Processing Engineering, Faculty of Engineering, Fukuyama University"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部情報処理工学科"},{"subitem_text_value":"福山大学情報処理センター"},{"subitem_text_value":"福山大学工学部情報処理工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2003-12-01"}],"displaytype":"detail","filename":"KJ00005781544.pdf","filesize":[{"value":"382.0 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/8148/files/KJ00005781544.pdf"},"version_id":"eb1e0259-1b76-4cca-b59f-246aa2cdd6ba"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"remanent magnetism","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"leakage magnetic flux testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"nondestructive testing","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"finite element method","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"magnetic field analysis","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"残留磁化を用いた漏洩磁束法による非破壊検査の有限要素解析","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"残留磁化を用いた漏洩磁束法による非破壊検査の有限要素解析"},{"subitem_title":"Finite Element Analysis of Nondestructive Testing by Leakage Flux Method Using Remanent Magnetism","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["711"],"pubdate":{"attribute_name":"公開日","attribute_value":"2003-12-01"},"publish_date":"2003-12-01","publish_status":"0","recid":"8148","relation_version_is_last":true,"title":["残留磁化を用いた漏洩磁束法による非破壊検査の有限要素解析"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:29:27.986691+00:00"}