WEKO3
インデックスリンク
アイテム
Research on Automatic Measurement of Impulse Magnetic Noise (VI) : Malfunction of Digital Circuit Caused by Electromagnetic Noise(B.Article,Special Edition for the 20th Anniversary of the University)
https://fukuyama-u.repo.nii.ac.jp/records/7952
https://fukuyama-u.repo.nii.ac.jp/records/7952c3c937ec-31d1-497c-9ed4-7698ff9faddd
| 名前 / ファイル | ライセンス | アクション |
|---|---|---|
KJ00005781338.pdf (614.0 kB)
|
|
| Item type | 紀要論文(ELS) / Departmental Bulletin Paper(1) | |||||
|---|---|---|---|---|---|---|
| 公開日 | 1995-11-01 | |||||
| タイトル | ||||||
| タイトル | Research on Automatic Measurement of Impulse Magnetic Noise (VI) : Malfunction of Digital Circuit Caused by Electromagnetic Noise(B.Article,Special Edition for the 20th Anniversary of the University) | |||||
| 言語 | en | |||||
| 言語 | ||||||
| 言語 | eng | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| 主題 | digital circuit | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| 主題 | malfunction | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| 主題 | external noise | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| 主題 | jitter | |||||
| キーワード | ||||||
| 言語 | en | |||||
| 主題Scheme | Other | |||||
| 主題 | CMOS logic IC | |||||
| 資源タイプ | ||||||
| 資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
| 資源タイプ | departmental bulletin paper | |||||
| ページ属性 | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | P(論文) | |||||
| 論文名よみ | ||||||
| その他のタイトル | Research on Automatic Measurement of Impulse Magnetic Noise (VI) : Malfunction of Digital Circuit Caused by Electromagnetic Noise(B.Article,Special Edition for the 20th Anniversary of the University) | |||||
| 著者名よみ | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42729 | |||||
| 姓名 | サノ, ヒロヤ | |||||
| 著者名よみ | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42730 | |||||
| 姓名 | ハンダ, ノブユキ | |||||
| 著者名よみ | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42731 | |||||
| 姓名 | カガワ, ナオキ | |||||
| 著者名(英) | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42732 | |||||
| 姓名 | SANO, Hiroya | |||||
| 言語 | en | |||||
| 著者名(英) | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42733 | |||||
| 姓名 | HANDA, Nobuyuki | |||||
| 言語 | en | |||||
| 著者名(英) | ||||||
| 識別子Scheme | WEKO | |||||
| 識別子 | 42734 | |||||
| 姓名 | KAGAWA, Naoki | |||||
| 言語 | en | |||||
| 著者所属(英) | ||||||
| 言語 | en | |||||
| 値 | Department of Electronic & Electric Engineering, Fukuyama University | |||||
| 著者所属(英) | ||||||
| 言語 | en | |||||
| 値 | Department of Electronic & Electric Engineering, Fukuyama University | |||||
| 著者所属(英) | ||||||
| 言語 | en | |||||
| 値 | Department of Electronic & Electric Engineering, Fukuyama University | |||||
| 抄録(英) | ||||||
| 内容記述タイプ | Other | |||||
| 内容記述 | A jitter on a digital signal is one of the causes for malfunctions of digital circuit. It is thought that this jitter is generated by many kinds of noises. We designed a digital board which was composed of high speed CMOS logic ICs and exposed on it the external electromagnetic noises from an antenna. By the measurement of the frequency characteristics of a jitter appeared by it, the relations between the jitter and the appearance of a malfunction on a circuit is examined. An electromagnetic wave has a sinusoidal waveform and its frequency is changed between the range of 20 to 200 MHz. As the results, it is found that the jitter has a few maximum and minimum values among the variation of electromagnetic frequency, and malfunction of the measured circuit appears on the discontinuous magnetic wave bands of the vicinity of the maximum values of the jitter. | |||||
| 雑誌書誌ID | ||||||
| 収録物識別子タイプ | NCID | |||||
| 収録物識別子 | AN00217655 | |||||
| 書誌情報 |
福山大学工学部紀要 巻 19, 号 1, p. 77-86, 発行日 1995-11 |
|||||
