{"created":"2023-06-19T09:50:55.077437+00:00","id":7876,"links":{},"metadata":{"_buckets":{"deposit":"44c5a23c-59e9-4136-9591-582983d967fc"},"_deposit":{"created_by":3,"id":"7876","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7876"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00007876","sets":["502:505:675:691"]},"author_link":["42359","42356","42358","42355","42357","42354"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1993","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"8","bibliographicPageStart":"1","bibliographicVolumeNumber":"16","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"佐野, 博也"}],"nameIdentifiers":[{"nameIdentifier":"42354","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松本, 史生"}],"nameIdentifiers":[{"nameIdentifier":"42355","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Experimental studies were made on electromagnetic susceptibility and malfunction of high speed CMOS digital printed circuit boards (PCB). We measured the induced noise voltage on a printed loop circuit caused by electromagnetic emission from an adjacent digital PCB. Electromagnetic susceptibility of a bus circuit was measured with a TEM cell in frequency range of 10 to 250 MHz. The induced noise increased near the resonance frequency of the circuit. We also measured the amplitude of noise voltage on a signal line that causes malfunction of a digital circuit, and the result shows that the marginal voltage depends on the supply voltage of CMOS circuit and the noise frequency.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"42356","nameIdentifierScheme":"WEKO"}],"names":[{"name":"サノ, ヒロヤ"}]},{"nameIdentifiers":[{"nameIdentifier":"42357","nameIdentifierScheme":"WEKO"}],"names":[{"name":"マツモト, フミオ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"42358","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SANO, Hiroya","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"42359","nameIdentifierScheme":"WEKO"}],"names":[{"name":"MATUMOTO, Fumio","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子・電気工学科"},{"subitem_text_value":"福山大学工学部電子・電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1993-01-01"}],"displaytype":"detail","filename":"KJ00005781262.pdf","filesize":[{"value":"792.3 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/7876/files/KJ00005781262.pdf"},"version_id":"383d1757-81ae-4606-902f-d64b22c96585"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"digital circuit","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electromagnetic susceptibility","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"printed circuit board","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"circuit resonance","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"induced noise","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"malfunction","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"インパルス性電磁雑音の自動測定に関する研究(IV) : 誘導雑音電磁界と回路の誤動作の関係","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"インパルス性電磁雑音の自動測定に関する研究(IV) : 誘導雑音電磁界と回路の誤動作の関係"},{"subitem_title":"Research on an Automatic Measurement of Impulse Electromagnetic Noise (IV) : Relation of Electromagnetic Induction Noise and Malfunction of Print Circuits","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["691"],"pubdate":{"attribute_name":"公開日","attribute_value":"1993-01-01"},"publish_date":"1993-01-01","publish_status":"0","recid":"7876","relation_version_is_last":true,"title":["インパルス性電磁雑音の自動測定に関する研究(IV) : 誘導雑音電磁界と回路の誤動作の関係"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:34:44.381854+00:00"}