{"created":"2023-06-19T09:50:53.814549+00:00","id":7856,"links":{},"metadata":{"_buckets":{"deposit":"2c76c2d4-a0cc-4c25-bed0-4c49ea2f57d8"},"_deposit":{"created_by":3,"id":"7856","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7856"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00007856","sets":["502:505:675:690"]},"author_link":["42265","42270","42267","42272","42273","42271","42268","42266","42269"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1993","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"16","bibliographicPageStart":"9","bibliographicVolumeNumber":"15","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"佐野, 博也"}],"nameIdentifiers":[{"nameIdentifier":"42265","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"千葉, 孝二"}],"nameIdentifiers":[{"nameIdentifier":"42266","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"松本, 史生"}],"nameIdentifiers":[{"nameIdentifier":"42267","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"This paper reports on electromagnetic noise immunity among different series of TTL-ICs. Each are mounted on a printed circuit board located adjacent to a small loop antenna driven by a sinusoidal wave of 100 MHz. Noise voltage was measured at an output of a TTL gate, of which logic state was fixed at \"low\" or \"high\". The noise voltage at its \"low\" state was larger than that of \"high\" state, because internal resistance of a TTL gate at \"low\" state is smaller than that at \"high\" state. The susceptibilities of TTLs of different series were compared using a TEM cell at frequency range of 10 to 500 MHz. As a result, the higher the speed of TTL was, the more the noise voltage increased, especially at the resonance frequency of a loop formed by printed traces, an 1C and a load. The electromagnetic immunity of AS-TTL was found 10 dB higher than that of LS-TTL.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"42268","nameIdentifierScheme":"WEKO"}],"names":[{"name":"サノ, ヒロヤ"}]},{"nameIdentifiers":[{"nameIdentifier":"42269","nameIdentifierScheme":"WEKO"}],"names":[{"name":"チバ, コウジ"}]},{"nameIdentifiers":[{"nameIdentifier":"42270","nameIdentifierScheme":"WEKO"}],"names":[{"name":"マツモト, フミオ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"42271","nameIdentifierScheme":"WEKO"}],"names":[{"name":"SANO, Hiroya","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"42272","nameIdentifierScheme":"WEKO"}],"names":[{"name":"CHIBA, Koozi","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"42273","nameIdentifierScheme":"WEKO"}],"names":[{"name":"MATUMOTO, Fumio","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子・電気工学科"},{"subitem_text_value":"福山大学工学部電子・電気工学科"},{"subitem_text_value":"福山大学工学部電子・電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1993-01-01"}],"displaytype":"detail","filename":"KJ00005781242.pdf","filesize":[{"value":"612.9 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/7856/files/KJ00005781242.pdf"},"version_id":"43ac5c62-9b25-46cf-b9f4-0c97f68fce7f"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"electromagnetic interference","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"printed circuit board","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electro-magnetic immunity","subitem_subject_language":"en","subitem_subject_scheme":"Other"},{"subitem_subject":"electromagnetic noise","subitem_subject_language":"en","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"インパルス性電磁雑音の自動測定に関する研究(III) : 放射電磁雑音のデイジタル回路基板への誘導","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"インパルス性電磁雑音の自動測定に関する研究(III) : 放射電磁雑音のデイジタル回路基板への誘導"},{"subitem_title":"Research on an Automatic Measurement of Impulse Electromagnetic Niose (III) : Induction of Radiated Electromagnetic Noise to Digital Circuit Board","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["690"],"pubdate":{"attribute_name":"公開日","attribute_value":"1993-01-01"},"publish_date":"1993-01-01","publish_status":"0","recid":"7856","relation_version_is_last":true,"title":["インパルス性電磁雑音の自動測定に関する研究(III) : 放射電磁雑音のデイジタル回路基板への誘導"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:35:03.452530+00:00"}