@article{oai:fukuyama-u.repo.nii.ac.jp:00007856,
 author = {佐野, 博也 and 千葉, 孝二 and 松本, 史生},
 journal = {福山大学工学部紀要},
 month = {},
 note = {P(論文), This paper reports on electromagnetic noise immunity among different series of TTL-ICs. Each are mounted on a printed circuit board located adjacent to a small loop antenna driven by a sinusoidal wave of 100 MHz. Noise voltage was measured at an output of a TTL gate, of which logic state was fixed at "low" or "high". The noise voltage at its "low" state was larger than that of "high" state, because internal resistance of a TTL gate at "low" state is smaller than that at "high" state. The susceptibilities of TTLs of different series were compared using a TEM cell at frequency range of 10 to 500 MHz. As a result, the higher the speed of TTL was, the more the noise voltage increased, especially at the resonance frequency of a loop formed by printed traces, an 1C and a load. The electromagnetic immunity of AS-TTL was found 10 dB higher than that of LS-TTL.},
 pages = {9--16},
 title = {インパルス性電磁雑音の自動測定に関する研究(III) : 放射電磁雑音のデイジタル回路基板への誘導},
 volume = {15},
 year = {1993}
}