{"created":"2023-06-19T09:50:49.363041+00:00","id":7786,"links":{},"metadata":{"_buckets":{"deposit":"733b7c59-c65f-4b3c-9b2e-5adcc7a0ff82"},"_deposit":{"created_by":3,"id":"7786","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7786"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00007786","sets":["502:505:675:687"]},"author_link":["41970","41969","41971"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1990","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"7","bibliographicPageStart":"1","bibliographicVolumeNumber":"12","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"植松, 滋幸"}],"nameIdentifiers":[{"nameIdentifier":"41969","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Fron the measurements of infrared transmittance and reflectance for titanium tungsten films on silicon substrate, index of refraction, infrared absorption coefficient and electrical conductivity were decided. The changes of refractive index is not strong on the thickness of titanium tugsten films at 3 μm of wavelength, but at 6μm the remarkable changes is obserbed. The difference is explained by more tight corelation between the incident photons and electrons in the film. Electrical conductivities were decreased at thinner film. The reason of the thickness dependence is that conduction electrons were scattered by both sides. Much more change at longer wavelength supports above the hypothesis.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41970","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ウエマツ, シゲユキ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41971","nameIdentifierScheme":"WEKO"}],"names":[{"name":"UEMATSU, Shigeyuki","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1990-01-01"}],"displaytype":"detail","filename":"KJ00005781142.pdf","filesize":[{"value":"469.1 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/7786/files/KJ00005781142.pdf"},"version_id":"8a285bb5-31d4-429f-afaa-2d1dfb55e44a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"赤外","subitem_subject_scheme":"Other"},{"subitem_subject":"光学薄膜","subitem_subject_scheme":"Other"},{"subitem_subject":"屈折率","subitem_subject_scheme":"Other"},{"subitem_subject":"チタン・タングステン膜","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"シリコン単結晶上のチタン・タングステン薄膜の赤外特性","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"シリコン単結晶上のチタン・タングステン薄膜の赤外特性"},{"subitem_title":"Infrared Characteristics for Titanium Tungsten Films on Silicon Substrate","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["687"],"pubdate":{"attribute_name":"公開日","attribute_value":"1990-01-01"},"publish_date":"1990-01-01","publish_status":"0","recid":"7786","relation_version_is_last":true,"title":["シリコン単結晶上のチタン・タングステン薄膜の赤外特性"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:36:23.912309+00:00"}