{"created":"2023-06-19T09:50:42.412993+00:00","id":7659,"links":{},"metadata":{"_buckets":{"deposit":"0db99afd-7c0d-40bd-b75e-4ff9dc4dc713"},"_deposit":{"created_by":3,"id":"7659","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7659"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00007659","sets":["502:505:675:680"]},"author_link":["41504","41503","41505"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1983","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"6","bibliographicPageStart":"1","bibliographicVolumeNumber":"5","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"飯田, 義直"}],"nameIdentifiers":[{"nameIdentifier":"41503","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"Distribution of the polyethylene-terephtalate film capacitors breakdown voltage is the minimum double exponential extreme value at the early period. When the heat worsen the property of the insulation film, the distribution of the breakdown voltage change to the maximum double exponential extreme value. The relation between the mode V_o of the breakdown voltage distribution and the temperature T (absolute temperature) is shown in next formula. V_o=A・exp (B/T), A and B is constant number. At the minimum extreme value distribution, relation between the breakdown voltage V and the probability F(V) having the breakdown voltage higher than V, is indicated in next formula. F(V)=exp. [(-exp. α(V-V_o))], where V_o is mode value.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41504","nameIdentifierScheme":"WEKO"}],"names":[{"name":"イイダ, ヨシナオ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41505","nameIdentifierScheme":"WEKO"}],"names":[{"name":"IIDA, Yoshinao","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_2":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_text_value":"研究報告"}]},"item_1_text_3":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Technical Paper"}]},"item_1_text_9":{"attribute_name":"著者所属(日)","attribute_value_mlt":[{"subitem_text_value":"福山大学工学部電子電気工学科"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1983-01-01"}],"displaytype":"detail","filename":"KJ00005780982.pdf","filesize":[{"value":"430.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/7659/files/KJ00005780982.pdf"},"version_id":"b0bee373-b6af-490c-a95e-c902768938f2"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"絶縁破壊電圧分布と熱劣化による変化","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"絶縁破壊電圧分布と熱劣化による変化"},{"subitem_title":"Distribution of the Breakdown Voltage and its Thermal Worsen","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["680"],"pubdate":{"attribute_name":"公開日","attribute_value":"1983-01-01"},"publish_date":"1983-01-01","publish_status":"0","recid":"7659","relation_version_is_last":true,"title":["絶縁破壊電圧分布と熱劣化による変化"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:39:07.435845+00:00"}