{"created":"2023-06-19T09:50:41.420696+00:00","id":7639,"links":{},"metadata":{"_buckets":{"deposit":"dcc2af39-58d2-4b3f-9a8a-07b31d3356ab"},"_deposit":{"created_by":3,"id":"7639","owners":[3],"pid":{"revision_id":0,"type":"depid","value":"7639"},"status":"published"},"_oai":{"id":"oai:fukuyama-u.repo.nii.ac.jp:00007639","sets":["502:505:675:678"]},"author_link":["41429","41430","41428","41426","41425","41427"],"item_1_biblio_info_14":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"1981","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"115","bibliographicPageStart":"111","bibliographicVolumeNumber":"3","bibliographic_titles":[{"bibliographic_title":"福山大学工学部紀要"}]}]},"item_1_creator_6":{"attribute_name":"著者名(日)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松井, 松長"}],"nameIdentifiers":[{"nameIdentifier":"41425","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"宮武, 将浩"}],"nameIdentifiers":[{"nameIdentifier":"41426","nameIdentifierScheme":"WEKO"}]}]},"item_1_description_1":{"attribute_name":"ページ属性","attribute_value_mlt":[{"subitem_description":"P(論文)","subitem_description_type":"Other"}]},"item_1_description_12":{"attribute_name":"抄録(英)","attribute_value_mlt":[{"subitem_description":"The purpose of this note is to propose a new method for measuring emissivity in the thermal infrared region of opaque or partially transparent bodies at or near room temperature. This method differs from Buettner-Kern method in the point that it makes no use of two different lids of a very high and very low emissivity.","subitem_description_type":"Other"}]},"item_1_full_name_7":{"attribute_name":"著者名よみ","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41427","nameIdentifierScheme":"WEKO"}],"names":[{"name":"マツイ, マツナガ"}]},{"nameIdentifiers":[{"nameIdentifier":"41428","nameIdentifierScheme":"WEKO"}],"names":[{"name":"ミヤタケ, マサヒロ"}]}]},"item_1_full_name_8":{"attribute_name":"著者名(英)","attribute_value_mlt":[{"nameIdentifiers":[{"nameIdentifier":"41429","nameIdentifierScheme":"WEKO"}],"names":[{"name":"MATSUI, Matsunaga","nameLang":"en"}]},{"nameIdentifiers":[{"nameIdentifier":"41430","nameIdentifierScheme":"WEKO"}],"names":[{"name":"MIYATAKE, Masahiro","nameLang":"en"}]}]},"item_1_source_id_13":{"attribute_name":"雑誌書誌ID","attribute_value_mlt":[{"subitem_source_identifier":"AN00217655","subitem_source_identifier_type":"NCID"}]},"item_1_text_10":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Department of Electronic and Electrical Engineering, Fukuyama University"},{"subitem_text_language":"en","subitem_text_value":"Department of Electronics, Kyoto Institute of Technology"}]},"item_1_text_2":{"attribute_name":"記事種別(日)","attribute_value_mlt":[{"subitem_text_value":"ノート"}]},"item_1_text_3":{"attribute_name":"記事種別(英)","attribute_value_mlt":[{"subitem_text_language":"en","subitem_text_value":"Technical Note"}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"1981-01-01"}],"displaytype":"detail","filename":"KJ00005780955.pdf","filesize":[{"value":"184.5 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"url":"https://fukuyama-u.repo.nii.ac.jp/record/7639/files/KJ00005780955.pdf"},"version_id":"750db176-3454-4dff-9779-61f4d7dd4dfa"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"常温物体の放射率の一測定法","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"常温物体の放射率の一測定法"},{"subitem_title":"A Novel Measuring Method of Emissivity in the Thermal Infrared Region","subitem_title_language":"en"}]},"item_type_id":"1","owner":"3","path":["678"],"pubdate":{"attribute_name":"公開日","attribute_value":"1981-01-01"},"publish_date":"1981-01-01","publish_status":"0","recid":"7639","relation_version_is_last":true,"title":["常温物体の放射率の一測定法"],"weko_creator_id":"3","weko_shared_id":-1},"updated":"2023-06-19T10:39:49.339993+00:00"}